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[IEEE 2019 IEEE/CVF Conference on Computer Vision and Pattern Recognition Workshops (CVPRW) - Long Beach, CA, USA (2019.6.16-2019.6.17)] 2019 IEEE/CVF Conference on Computer Vision and Pattern Recognition Workshops (CVPRW) - Cut Quality Estimation in Industrial Laser Cutting Machines: A Machine Learning Approach
Santolini, Giorgio, Rota, Paolo, Gandolfi, Davide, Bosetti, PaoloYear:
2019
DOI:
10.1109/CVPRW.2019.00052
File:
PDF, 4.42 MB
2019