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[IEEE 2020 Device Research Conference (DRC) - Columbus, OH, USA (2020.6.21-2020.6.24)] 2020 Device Research Conference (DRC) - Reliability of Ferroelectric HfO 2 -based Memories: From MOS Capacitor to FeFET
Tan, Ava J., Wang, Li-Chen, Liao, Yu-Hung, Bae, Jong-Ho, Hu, Chenming, Salahuddin, SayeefYear:
2020
DOI:
10.1109/DRC50226.2020.9135148
File:
PDF, 2.17 MB
2020