[IEEE 2020 Device Research Conference (DRC) - Columbus, OH,...

  • Main
  • [IEEE 2020 Device Research Conference...

[IEEE 2020 Device Research Conference (DRC) - Columbus, OH, USA (2020.6.21-2020.6.24)] 2020 Device Research Conference (DRC) - Reliability of Ferroelectric HfO 2 -based Memories: From MOS Capacitor to FeFET

Tan, Ava J., Wang, Li-Chen, Liao, Yu-Hung, Bae, Jong-Ho, Hu, Chenming, Salahuddin, Sayeef
How much do you like this book?
What’s the quality of the file?
Download the book for quality assessment
What’s the quality of the downloaded files?
Year:
2020
DOI:
10.1109/DRC50226.2020.9135148
File:
PDF, 2.17 MB
2020
Conversion to is in progress
Conversion to is failed