![](/img/cover-not-exists.png)
[IEEE 2020 Symposium on Design, Test, Integration & Packaging of MEMS and MOEMS (DTIP) - Lyon, France (2020.6.15-2020.6.26)] 2020 Symposium on Design, Test, Integration & Packaging of MEMS and MOEMS (DTIP) - Two-port integrated planar devices frequency characterization
Oumar, D.A., Boukhari, M.I., Capraro, S., Pietroy, D., Chatelon, J.P., Rousseau, J.J.Year:
2020
DOI:
10.1109/DTIP51112.2020.9139141
File:
PDF, 1.00 MB
2020