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Temperature Dependent Reliability of Polysilicon Emitter Bipolar Transistors under High Current Stress
Zhu, Kunfeng, Zhang, Peijian, Chen, Wensuo, Xu, Xueliang, Tan, Kaizhou, Gui, Jinle, Yang, Yonghui, Jiang, FeiyuYear:
2020
Journal:
IEEE Transactions on Device and Materials Reliability
DOI:
10.1109/TDMR.2020.3006982
File:
PDF, 697 KB
2020