[IEEE 2020 Design, Automation & Test in Europe Conference & Exhibition (DATE) - Grenoble, France (2020.3.9-2020.3.13)] 2020 Design, Automation & Test in Europe Conference & Exhibition (DATE) - Flexible Group-Level Pruning of Deep Neural Networks for On-Device Machine Learning
Lee, Kwangbae, Kim, Hoseung, Lee, Hayun, Shin, DongkunYear:
2020
DOI:
10.23919/date48585.2020.9116287
File:
PDF, 1.41 MB
2020