Inter-turn Short Circuit Diagnosis Using New D-Q...

Applied Sciences 2020 / 03 Vol. 10; Iss. 6

Inter-turn Short Circuit Diagnosis Using New D-Q Synchronous Min–Max Coordinate System and Linear Discriminant Analysis

Goh, Yeong-Jin, Kim, Kyoung-Min
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Volume:
10
Journal:
Applied Sciences
DOI:
10.3390/app10061996
Date:
March, 2020
File:
PDF, 6.25 MB
2020
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