Focused Ion Beam (FIB) Milling Damage Formed During Tem...

Focused Ion Beam (FIB) Milling Damage Formed During Tem Sample Preparation of Silicon

Susnitzky, David W., Johnson, Kevin D.
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Volume:
4
Journal:
Microscopy and Microanalysis
DOI:
10.1017/S1431927600023400
Date:
July, 1998
File:
PDF, 2.02 MB
1998
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