Structure of natural film on porous silicon surface founded...

Molecular Crystals and Liquid Crystals 2020 / 02 Vol. 698; Iss. 1

Structure of natural film on porous silicon surface founded by ellipsometry

Odarych, V. A., Poperenko, L. V., Yurgelevych, I. V.
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Volume:
698
Journal:
Molecular Crystals and Liquid Crystals
DOI:
10.1080/15421406.2020.1731086
Date:
February, 2020
File:
PDF, 1.24 MB
2020
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