[IEEE 2020 IEEE International Reliability Physics Symposium...

  • Main
  • [IEEE 2020 IEEE International...

[IEEE 2020 IEEE International Reliability Physics Symposium (IRPS) - Dallas, TX, USA (2020.4.28-2020.5.30)] 2020 IEEE International Reliability Physics Symposium (IRPS) - Fast Neutron Irradiation Effects on Multiple Gallium Nitride (GaN) Device Reliability in Presence of Ambient Variations

Soriano, Luis, Valencia, Hector, Sun, Ke-Xun, Nelson, Ronald
How much do you like this book?
What’s the quality of the file?
Download the book for quality assessment
What’s the quality of the downloaded files?
Year:
2020
DOI:
10.1109/IRPS45951.2020.9129517
File:
PDF, 785 KB
2020
Conversion to is in progress
Conversion to is failed