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[IEEE 2020 IEEE International Reliability Physics Symposium (IRPS) - Dallas, TX, USA (2020.4.28-2020.5.30)] 2020 IEEE International Reliability Physics Symposium (IRPS) - Fast Neutron Irradiation Effects on Multiple Gallium Nitride (GaN) Device Reliability in Presence of Ambient Variations
Soriano, Luis, Valencia, Hector, Sun, Ke-Xun, Nelson, RonaldYear:
2020
DOI:
10.1109/IRPS45951.2020.9129517
File:
PDF, 785 KB
2020