[IEEE 2020 IEEE International Workshop on Metrology for Industry 4.0 & IoT (MetroInd4.0&IoT) - Roma, Italy (2020.6.3-2020.6.5)] 2020 IEEE International Workshop on Metrology for Industry 4.0 & IoT - A New Class of Chaotic Sources in Programmable Logic Devices
Addabbo, Tommaso, Fort, Ada, Moretti, Riccardo, Mugnaini, Marco, Takaloo, Hadis, Vignoli, ValerioYear:
2020
DOI:
10.1109/MetroInd4.0IoT48571.2020.9138256
File:
PDF, 7.68 MB
2020