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[IEEE 2020 IEEE International Reliability Physics Symposium (IRPS) - Dallas, TX, USA (2020.4.28-2020.5.30)] 2020 IEEE International Reliability Physics Symposium (IRPS) - A New Implementation Approach for Reliability Design Rules against Plasma Induced Charging Damage from Well Configurations of Complex ICs
Martin, Andreas, Kamp, AngelikaYear:
2020
DOI:
10.1109/irps45951.2020.9128866
File:
PDF, 1.02 MB
2020