Quantitative depth-profile analysis of transition metal nitride materials with combined grazing-incidence X-ray fluorescence and X-ray reflectometry analysis
Torrengo, S., Eichert, D., Mazel, Y., Bernard, M., Ménesguen, Y., Lépy, M.C., Nolot, E.Journal:
Spectrochimica Acta Part B: Atomic Spectroscopy
DOI:
10.1016/j.sab.2020.105926
Date:
July, 2020
File:
PDF, 1.41 MB
2020