An adaptive simulation framework for AMS-RF test quality

Integration, the VLSI Journal 2020 / 07 Vol. 73

An adaptive simulation framework for AMS-RF test quality

Gutierrez, Valentin, Leger, Gildas
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Volume:
73
Journal:
Integration
DOI:
10.1016/j.vlsi.2020.03.003
Date:
July, 2020
File:
PDF, 1.22 MB
2020
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