[IEEE 2020 IEEE International Reliability Physics Symposium (IRPS) - Dallas, TX, USA (2020.4.28-2020.5.30)] 2020 IEEE International Reliability Physics Symposium (IRPS) - Hot-Carrier induced Breakdown events from Off to On mode in NEDMOS
Bravaix, Alain, Kussener, Edith, Ney, David, Federspiel, Xavier, Cacho, FlorianYear:
2020
DOI:
10.1109/IRPS45951.2020.9129214
File:
PDF, 811 KB
2020