Improving a-InGaZnO TFTs Reliability by Optimizing Electrode Capping Structure under Negative Bias Illumination Stress
Tu, Yu-Fa, Lu, I-Nien, Chen, Hong-Chih, Su, Wan-Ching, Hung, Yang-Hao, Zhou, Kuan-Ju, Zheng, Yu-Zhe, Sun, Li-Chuan, Shih, Yu-Shan, Chen, Jian-Jie, Lien, Chih-Ying, Huang, Hui-Chun, Lien, Chen-Hsin, ChYear:
2020
Journal:
IEEE Electron Device Letters
DOI:
10.1109/LED.2020.3006487
File:
PDF, 939 KB
2020