Defect-Oriented Test: Effectiveness in High Volume...

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IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems 2020

Defect-Oriented Test: Effectiveness in High Volume Manufacturing

Hapke, F., Howell, W., Maxwell, P., Brazil, E., Venkataraman, S., Rudrajit, D., Glowatz, A., Fast, A., Rajski, J.
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Year:
2020
Journal:
IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems
DOI:
10.1109/TCAD.2020.3001259
File:
PDF, 1.80 MB
2020
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