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An advanced 2Ï method enabling thermal conductivity measurement for various sample thicknesses: From thin films to bulk materials
Mitarai, Kosuke, Okuhata, Ryo, Chikada, Jinichiro, Kaneko, Tatsuya, Uematsu, Yuto, Komatsubara, Yuki, Ishibe, Takafumi, Nakamura, YoshiakiVolume:
128
Journal:
Journal of Applied Physics
DOI:
10.1063/5.0007302
Date:
July, 2020
File:
PDF, 1.82 MB
2020