Area-Efficient and Reliable Error Correcting Code Circuit Based on Hybrid CMOS/Memristor Circuit
Ishizaka, Mamoru, Shintani, Michihiro, Inoue, MichikoJournal:
Journal of Electronic Testing
DOI:
10.1007/s10836-020-05892-3
Date:
July, 2020
File:
PDF, 1.43 MB
2020