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Area-Efficient and Reliable Error Correcting Code Circuit Based on Hybrid CMOS/Memristor Circuit

Ishizaka, Mamoru, Shintani, Michihiro, Inoue, Michiko
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Journal:
Journal of Electronic Testing
DOI:
10.1007/s10836-020-05892-3
Date:
July, 2020
File:
PDF, 1.43 MB
2020
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