[IEEE 2020 Design, Automation & Test in Europe Conference & Exhibition (DATE) - Grenoble, France (2020.3.9-2020.3.13)] 2020 Design, Automation & Test in Europe Conference & Exhibition (DATE) - An On-Chip Learning Accelerator for Spiking Neural Networks using STT-RAM Crossbar Arrays
Kulkarni, Shruti R., Yin, Shihui, Seo, Jae-sun, Rajendran, BipinYear:
2020
DOI:
10.23919/DATE48585.2020.9116226
File:
PDF, 627 KB
2020