Contamination of TEM Holders Quantified and Mitigated With...

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Microscopy and Microanalysis 2020 / 07

Contamination of TEM Holders Quantified and Mitigated With the Open-Hardware, High-Vacuum Bakeout System

Goh, Yin Min, Schwartz, Jonathan, Rennich, Emily, Ma, Tao, Kerns, Bobby, Hovden, Robert
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Journal:
Microscopy and Microanalysis
DOI:
10.1017/S1431927620001762
Date:
July, 2020
File:
PDF, 695 KB
2020
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