[IEEE 2020 IEEE International Memory Workshop (IMW) -...

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[IEEE 2020 IEEE International Memory Workshop (IMW) - Dresden, Germany (2020.5.17-2020.5.20)] 2020 IEEE International Memory Workshop (IMW) - Characterization of Single-Poly SGLC Cell Using 4kbits Array Test Chip for a Low Density Code Storage Embedded NVM Applications

Park, Sung-Kun, Lee, Yong-Seop, Kim, Do-Hee, Kim, Nam-Yoon, Choiv, Kwang-Il
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Year:
2020
DOI:
10.1109/IMW48823.2020.9108139
File:
PDF, 1.22 MB
2020
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