[IEEE 2020 IEEE International Memory Workshop (IMW) - Dresden, Germany (2020.5.17-2020.5.20)] 2020 IEEE International Memory Workshop (IMW) - Characterization of Single-Poly SGLC Cell Using 4kbits Array Test Chip for a Low Density Code Storage Embedded NVM Applications
Park, Sung-Kun, Lee, Yong-Seop, Kim, Do-Hee, Kim, Nam-Yoon, Choiv, Kwang-IlYear:
2020
DOI:
10.1109/IMW48823.2020.9108139
File:
PDF, 1.22 MB
2020