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[IEEE 2020 36th Semiconductor Thermal Measurement, Modeling & Management Symposium (SEMI-THERM) - San Jose, CA, USA (2020.3.16-2020.3.20)] 2020 36th Semiconductor Thermal Measurement, Modeling & Management Symposium (SEMI-THERM) - Measurement of Performance Characterization of Ultra-Thin Vapor Chamber
Lin, Wei-Keng, Zhang, Wen-Hua, Huang, Chien, Tsai, Ching-Huang, Hsaio, KennyYear:
2020
DOI:
10.23919/SEMI-THERM50369.2020.9142852
File:
PDF, 1.02 MB
2020