![](/img/cover-not-exists.png)
Machine learning method to predict threshold voltage distribution by read disturbance in 3D NAND Flash Memories
Park, Jihye, Lee, Jang Kyu, Shin, HyungcheolJournal:
Japanese Journal of Applied Physics
DOI:
10.35848/1347-4065/aba5e0
Date:
July, 2020
File:
PDF, 1.12 MB
2020