Impact of circuit metallization on dielectric permittivity...

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Impact of circuit metallization on dielectric permittivity measurement by scanning microwave microscopy

Sakamaki, Ryo, Hirano, Iku, Horibe, Masahiro
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Journal:
Japanese Journal of Applied Physics
DOI:
10.35848/1347-4065/aba73a
Date:
July, 2020
File:
PDF, 1.04 MB
2020
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