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[IEEE 2020 IEEE International Reliability Physics Symposium (IRPS) - Dallas, TX, USA (2020.4.28-2020.5.30)] 2020 IEEE International Reliability Physics Symposium (IRPS) - Enhanced Threshold Voltage Stability in ZnO Thin-Film-Transistors by Excess of Oxygen in Atomic Layer Deposited Al 2 O 3
Rodriguez-Davila, R. A., Chapman, R. A., Catalano, M., Quevedo-Lopez, M., Young, C.D.Year:
2020
DOI:
10.1109/IRPS45951.2020.9129345
File:
PDF, 931 KB
2020