Characterizing crystalline defects in single Xe...

Journal of Physics Conference Series 2020 / 01 Vol. 1412

Characterizing crystalline defects in single Xe nanoparticles from angular correlations of single-shot diffracted X-rays

Niozu, A, Kumagai, Y, Nishiyama, T, Fukuzawa, H, Motomura, K, Bucher, M, Ito, Y, Takanashi, T, Asa, K, Sato, Y, You, D, Li, Y, Ono, T, Kukk, E, Miron, C, Neagu, L, Callegari, C, Fraia, M Di, Rossi, G,
How much do you like this book?
What’s the quality of the file?
Download the book for quality assessment
What’s the quality of the downloaded files?
Volume:
1412
Journal:
Journal of Physics: Conference Series
DOI:
10.1088/1742-6596/1412/20/202028
Date:
January, 2020
File:
PDF, 609 KB
2020
Conversion to is in progress
Conversion to is failed