Near-field characterization of ultra-thin metal films

Near-field characterization of ultra-thin metal films

Yakubovsky, D I, Arsenin, A V, Kirtaev, R V, Ermolaev, G A, Stebunov, Y S, Volkov, V S
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Volume:
1461
Journal:
Journal of Physics: Conference Series
DOI:
10.1088/1742-6596/1461/1/012193
Date:
March, 2020
File:
PDF, 955 KB
2020
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