Space charge limited current (SCLC) as observed on diamond surface damaged by MeV ion implantation
Wang, H, Bruna, M, Olivero, P, Borini, S, Picollo, F, Budnyk, O, Bosia, F, Pastuovic, Ž, Skukan, N, JakÅ¡iÄ, M, Vittone, EVolume:
16
Journal:
IOP Conference Series: Materials Science and Engineering
DOI:
10.1088/1757-899x/16/1/012004
Date:
November, 2010
File:
PDF, 1.14 MB
2010