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Numerical Simulation of the Reliability of In-Situ Eddy Current Testing Considering the Influence of Penetration Depth
Tian, P Q, Zhan, S Z, Feng, Y W, Zhang, X L, Xue, X FVolume:
608
Journal:
IOP Conference Series: Materials Science and Engineering
DOI:
10.1088/1757-899x/608/1/012001
Date:
August, 2019
File:
PDF, 641 KB
2019