COMPEL - The international journal for computation and mathematics in electrical and electronic engineering
2020 / 04 Vol. 39; Iss. 3
Scattering by cracks in a conducting surface
Jacobs, Ralf T., Kost, ArnulfVolume:
39
Journal:
COMPEL - The international journal for computation and mathematics in electrical and electronic engineering
DOI:
10.1108/compel-10-2019-0407
Date:
April, 2020
File:
PDF, 567 KB
2020