![](/img/cover-not-exists.png)
[IEEE 2020 IEEE Applied Power Electronics Conference and Exposition (APEC) - New Orleans, LA, USA (2020.3.15-2020.3.19)] 2020 IEEE Applied Power Electronics Conference and Exposition (APEC) - A Driving Loss and Speed Co-Optimized Series Resonant Gate Driver with Novel Time Segmented Methodology for High Frequency SiC MOSFETs
Peng, Hao, Peng, Han, Dang, Ziyue, Kang, Yong, Wang, Zhiqiang, He, Maojun, Liu, XudanYear:
2020
DOI:
10.1109/APEC39645.2020.9124508
File:
PDF, 2.13 MB
2020