A Reliability-Aware Joint Design Method of Application...

IEEE Access 2020 Vol. 8

A Reliability-Aware Joint Design Method of Application Mapping and Wavelength Assignment for WDM-Based Silicon Photonic Interconnects on Chip

Li, Hui, Liu, Feiyang, Gu, Huaxi, Chu, Zhuqin, Ye, Xiaochun
How much do you like this book?
What’s the quality of the file?
Download the book for quality assessment
What’s the quality of the downloaded files?
Volume:
8
Year:
2020
Journal:
IEEE Access
DOI:
10.1109/access.2020.2987928
File:
PDF, 2.70 MB
2020
Conversion to is in progress
Conversion to is failed