A Transient Bulging Phenomenon in Fast Doping Processes for...

IEEE Access 2020 Vol. 8

A Transient Bulging Phenomenon in Fast Doping Processes for p-n Junctions

Zhang, Jihong, Shih, Tienmo
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Volume:
8
Year:
2020
Journal:
IEEE Access
DOI:
10.1109/access.2020.3007486
File:
PDF, 1.33 MB
2020
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