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A smart technique for attendance system to recognize faces through parallelism
Prabhavathi, B, Tanuja, V, Viswanatham, V Madhu, Babu, M RajashekharaVolume:
263
Journal:
IOP Conference Series: Materials Science and Engineering
DOI:
10.1088/1757-899x/263/4/042095
Date:
November, 2017
File:
PDF, 482 KB
2017