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Simulation of Potential Distribution and Leakage Current of 800kV DC Arrester under Different Degrees of Degradation
Zhang, Pipei, Shi, Wei, Wang, Hui, Sun, Jingwen, Wang, PengVolume:
486
Journal:
IOP Conference Series: Materials Science and Engineering
DOI:
10.1088/1757-899x/486/1/012148
Date:
July, 2019
File:
PDF, 696 KB
2019