Investigation of memristor effect on basis of thin-film...

Investigation of memristor effect on basis of thin-film oxide dielectrics modified by carbon

Sakharov, Yu V
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Volume:
498
Journal:
IOP Conference Series: Materials Science and Engineering
DOI:
10.1088/1757-899x/498/1/012029
Date:
April, 2019
File:
PDF, 517 KB
2019
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