Raman Scattering and Carrier Diffusion Study in Heavily Co-doped 6H-SiC Layers
Gulbinas, K, Å Äajev, P, Bikbajavas, V, Grivickas, V, Korolik, O V, Mazanik, A V, Fedotov, A K, JokubaviÄius, V, Linnarsson, M K, Syväjärvi, M, Kamiyama, SVolume:
56
Journal:
IOP Conference Series: Materials Science and Engineering
DOI:
10.1088/1757-899x/56/1/012005
Date:
March, 2014
File:
PDF, 1.19 MB
2014