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Force and resolution analysis in Kelvin probe force microscopy using nanotube probes
Xu, Jie, Chen, Jianfeng, Chen, Long, Cai, Yuanlingyun, Yu, Tianqi, Li, JinzeVolume:
592
Journal:
IOP Conference Series: Materials Science and Engineering
DOI:
10.1088/1757-899x/592/1/012036
Date:
September, 2019
File:
PDF, 639 KB
2019