Force and resolution analysis in Kelvin probe force...

IOP Conference Series Materials Science and Engineering 2019 / 09 Vol. 592

Force and resolution analysis in Kelvin probe force microscopy using nanotube probes

Xu, Jie, Chen, Jianfeng, Chen, Long, Cai, Yuanlingyun, Yu, Tianqi, Li, Jinze
How much do you like this book?
What’s the quality of the file?
Download the book for quality assessment
What’s the quality of the downloaded files?
Volume:
592
Journal:
IOP Conference Series: Materials Science and Engineering
DOI:
10.1088/1757-899x/592/1/012036
Date:
September, 2019
File:
PDF, 639 KB
2019
Conversion to is in progress
Conversion to is failed