Statistical model of passive tag for production processes automation RFID system parametric failures
Sinyakin, V Yu, Makeev, M O, Meshkov, S A, Shashurin, V DVolume:
709
Journal:
IOP Conference Series: Materials Science and Engineering
DOI:
10.1088/1757-899x/709/4/044048
Date:
January, 2020
File:
PDF, 305 KB
2020