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Injection and trapping of electrons in Y 2 O 3 layers on Si
Wang, W C, Badylevich, M, Afanas'ev, V V, Stesmans, A, Adelmann, C, Elshocht, S Van, Kittl, J A, Lukosius, M, Walczyk, Ch, Wenger, ChVolume:
8
Journal:
IOP Conference Series: Materials Science and Engineering
DOI:
10.1088/1757-899x/8/1/012028
Date:
February, 2010
File:
PDF, 479 KB
2010