Process variation and analysis of FinFET for low-power...

IOP Conference Series Materials Science and Engineering 2020 / 06 Vol. 872

Process variation and analysis of FinFET for low-power applications

Verma, Shekhar, Lata Tripathi, Suman
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Volume:
872
Journal:
IOP Conference Series: Materials Science and Engineering
DOI:
10.1088/1757-899x/872/1/012015
Date:
June, 2020
File:
PDF, 931 KB
2020
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