Annealing effects on resistive switching of IGZO-based CBRAM devices
Gan, Kai-Jhih, Liu, Po-Tsun, Ruan, Dun-Bao, Chiu, Yu-Chuan, Sze, Simon M.Journal:
Vacuum
DOI:
10.1016/j.vacuum.2020.109630
Date:
July, 2020
File:
PDF, 2.02 MB
2020