[IEEE 2020 4th IEEE Electron Devices Technology & Manufacturing Conference (EDTM) - Penang, Malaysia (2020.4.6-2020.4.21)] 2020 4th IEEE Electron Devices Technology & Manufacturing Conference (EDTM) - An Investigation of Transmission Line Modeling Test Structure in TCAD
PC, Thanh, Phuong, Duy Nguyen, Holland, Anthony, Fechete, AlexandruYear:
2020
DOI:
10.1109/edtm47692.2020.9117864
File:
PDF, 468 KB
2020