Polarimetry of light scattered by surface roughness and...

Polarimetry of light scattered by surface roughness and textured films and periodic structures in nanotechnologies: a new challenge in instrumentation and modeling

Ferrieu., F.
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Volume:
5
Year:
2010
Journal:
EPJ Web of Conferences
DOI:
10.1051/epjconf/20100504001
File:
PDF, 1.05 MB
2010
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