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Classifying Wastes Using Random Forests, Gaussian Naïve Bayes, Support Vector Machine and Multilayer Perceptron
Hanbal, Ibrahim F., Ingosan, Jeffrey S., Oyam, Neal Arden A., Hu, YafengVolume:
803
Journal:
IOP Conference Series: Materials Science and Engineering
DOI:
10.1088/1757-899x/803/1/012017
Date:
May, 2020
File:
PDF, 409 KB
2020