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[IEEE 2020 IEEE International Reliability Physics Symposium (IRPS) - Dallas, TX, USA (2020.4.28-2020.5.30)] 2020 IEEE International Reliability Physics Symposium (IRPS) - Impact of Extrinsic Variation Sources on the Device-to-Device Variation in Ferroelectric FET
Ni, Kai, Gupta, Aniket, Prakash, Om, Thomann, Simon, Hu, X. Sharon, Amrouch, HussamYear:
2020
DOI:
10.1109/IRPS45951.2020.9128323
File:
PDF, 1.62 MB
2020