Improvement in bias stress stability of solution-processed amorphous InZnO thin-film transistors via low-temperature photosensitive passivation
Safaruddin, Aimi Syairah, Bermundo, Juan Paolo S., Yoshida, Naofumi, Nonaka, Toshiaki, Fujii, Mami N., Ishikawa, Yasuaki, Uraoka, YukiharuYear:
2020
Journal:
IEEE Electron Device Letters
DOI:
10.1109/LED.2020.3011683
File:
PDF, 1.23 MB
2020
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