[IEEE 2020 23rd International Symposium on Design and Diagnostics of Electronic Circuits & Systems (DDECS) - Novi Sad, Serbia (2020.4.22-2020.4.24)] 2020 23rd International Symposium on Design and Diagnostics of Electronic Circuits & Systems (DDECS) - KL-cuts influence on optimization of polymorphic circuits based on PAIG rewriting
Crha, Adam, Simek, Vaclav, Ruzicka, RichardYear:
2020
DOI:
10.1109/ddecs50862.2020.9095557
File:
PDF, 280 KB
2020