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[IEEE 2020 23rd International Symposium on Design and Diagnostics of Electronic Circuits & Systems (DDECS) - Novi Sad, Serbia (2020.4.22-2020.4.24)] 2020 23rd International Symposium on Design and Diagnostics of Electronic Circuits & Systems (DDECS) - Applicative System Level Test introduction to Increase Confidence on Screening Quality
Bernardi, P., Restifo, M., Reorda, M. Sonza, Appello, D., Bertani, C., Petrali, D.Year:
2020
DOI:
10.1109/ddecs50862.2020.9095569
File:
PDF, 400 KB
2020