[IEEE 2020 23rd International Symposium on Design and Diagnostics of Electronic Circuits & Systems (DDECS) - Novi Sad, Serbia (2020.4.22-2020.4.24)] 2020 23rd International Symposium on Design and Diagnostics of Electronic Circuits & Systems (DDECS) - Automatic Design of Reliable Systems Based on the Multiple-choice Knapsack Problem
Lojda, Jakub, Podivinsky, Jakub, Cekan, Ondrej, Panek, Richard, Krcma, Martin, Kotasek, ZdenekYear:
2020
DOI:
10.1109/ddecs50862.2020.9095576
File:
PDF, 474 KB
2020